G29-00-159-ProSCT, Portable DC SPD Tester, 1500VDC,  0.1 - 1mA test current, Integrated battery with up to two years lifetime, TFT Touch screen. For DC Testing of MOV, GDT, TVS  with LOG Mode, Auto Detect, Date of Event, Includes Suitcase and Quick Connect Adaptor   General Description For Functional Testing/Measurement of MOV, GDT, TVS. With Logging, auto Detection and Date of Event Features Features With the G29 ProSCT you can measure MOV, GDT, TVS, Surge Protection Device Tester (DC) Test current MOV/TVS 0.1mA:0.5mA:1mA Test Voltage 1500VDC (max) Voltage Ramp (GDT) 100V/s; 1000V/s Integrated battery Automatic connection detection Operating Temperature -10 °C to 50 °C IP20 UL(4V0 Plastic Housing 320x240 pixel TFT Colour with Touch Screen interface Comes with Quick connect adaptor and Suitcase Datasheet Product Datasheet  

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TP0620 Portable High Powered Semiconductor Tester General Description The TP 0620 is designed for easy and fast functional control of all major brands of power semiconductors in the lab or on site. Features With the TP 0620 you can measure Breakdown voltage VD-VR Leakage current ID - IR Forward voltage drop VF, VT on IGBT - Diodes - Thyristors and other components. Easy to manipulate and use in the lab or in the field by technicians and engineers. TP062 contains a current generator, high voltage generator, a gate drive and internal measuring circuits. Supplied with the necessary test leads, you don’t need anything else. LCD Display in 5 languages, (English, French, German, Italian, Spanish) for : Test to be carried out - Parameters - Test results This is an extremely practical tool which will save you time in testing and reduce your costs. By using this professional tool instead of a laboratory bench set-up you can increase your efficiency. You can increase your proficiency by making reliable measurement and reduce repair time/down time by fast and accurate localization of faulty devices. Characteristics Forward voltage drop VF- VT Breakdown voltage VD - VR Applied current : 1 - 600 A Applied current: 0.1 - 10 mA Voltage measure of : 0 - 10 V Voltage measurement : 50 - 2000V Go-no go test : limits 0.0 - 9.9 V Go-no go test : limits 50 - 1990V Leakage current ID - IR Gate Drive Parameters Applied voltage: 50 - 2000V VG :15V for firing, 0V for blocking Measure of current: 0 - 10 mA Ri, Gate drive internal resistance 68Ω. Test go-no go : limits 0.00 - 9.90 mA Imax = 200 mA General Requirements Isolation 1 kV Test pulse frequency: 0.3 Hz. Power supply 85 - 264Vac 50/60Hz or 110 - 340VDC Tester weight 12lb - 5.5 kg, with box 24lb - 11kg Dimensions HxWxD 7.6’’ - 198mm x 14’’ - 357mm x 7’’ - 178mm Protection IP 20 The equipment has a multi-range power input for DC and ac-supplies. Optionally available is a complementary low voltage DC-supply. Comes with Power and Test Cables and Operational Manual Datasheet Product Datasheet

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I30 Power Semiconductor Tester Service Product Family (Obsolete) Applications To measure forward voltage drop VT at given current range. Suitable to power components: Diodes, Thyristors, GTO… Programmable current values (ITA and ITB) through thumb wheel to trigger measurement of the direct voltage drop (VTA,VTB). Three measurement options for VTA and VTB: At ITpeakOn the positive slope of ITOn the negative slope of IT Higher IT available upon request. IT Current range: Forward voltage: 100 – 3000 A 0 – 5 V VG (Gate command voltage)=VG1 + VG2 (two gate pulses)VG1= 20V 50 μs up to 25 AVG2= 20V 10 ms up to 5 A Datasheet Contact Us for Possible Replacement

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